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Scanning Electron
Microscopy (SEM) - images the surface (topography)
of virtually any solid materials or biological sample
with magnifications from 20x to >50,000x. A particular
feature of the SEM is the large depth of focus of the
images. Hard copy and digital images can be produced.
Instrument: JEOL JSM 6310
Electron Probe Microanalysis (EDX) - uses x-rays
emitted from the sample (under investigation in the
SEM) to determine the elemental composition (qualitative
and quantitative) of areas or features, of the sample,
with dimensions down to ~ 1µm. Instrument: Oxford
ISIS
Cryogenic Stage - enables delicate specimens
to be maintained at liquid nitrogen temperatures while
being examined in the SEM.
Transmission Electron Microscopy (TEM) - images
the internal structure of very thin materials and biological
samples at magnifications up to at least 250,000x and
also includes electron diffraction and EDX capabilities.
Instrument: JEOL 100CX
Light Microscopy (LM) - photomicrographs, in both
hard copy and digital form, can be obtained using either
reflected or transmitted light.
Image processing and analysis - facilities are
available for processing and analysing digital images
from the SEM and LM
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